Design For Test (DFT)

Ensuring Testability from Concept to Silicon

Design For Testability

Asmicore offers high-efficiency DFT solutions for complex SoCs and advanced nodes. We streamline testing and debugging to accelerate time-to-market while meeting PPA goals. Our end-to-end DFT services include scan insertion, ATPG, MBIST, Logic BIST, and more. We ensure RTL and physical-level integration, supporting power-gated and ECO-heavy designs. Our flows are compatible with Synopsys, Cadence, and Siemens EDA tools. Whether you’re developing automotive chips, mobile SoCs, AI accelerators, or low-power IoT devices, we deliver effective cross-domain DFT solutions. With Asmicore, you gain agility, reliability, and innovation in every stage of your DFT journey and we ensure with care that Clients benefit from full-chip or block-level DFT ownership based on specific design needs.

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“Everything is designed to turn insights into action – faster decisions, cleaner execution, and better results.”

— Founder & CEO

Summary on Competency

Scan & Test Architecture

  • Scan chain insertion and stitching — full and partial scan
  • Hierarchical scan implementation
  • Chain balancing and scan chain reordering
  • Test compression integration
  • Clock controller insertion for scan/capture phase management
  • DFT design constraint definition — SDC, test modes and timing exceptions
  • Boundary scan and JTAG integration — IEEE 1149.1 / 1149.6
  • iJTAG — IEEE 1687
  • IEEE 1500 wrapper insertion

ATPG & Fault Analysis

  • High-coverage ATPG
  • Stuck-at, transition and path-delay fault testing
  • Fault simulation and fault grading
  • Test pattern generation and optimization
  • Debug analysis and test coverage improvement
  • Timing simulation and validation of scan and at-speed patterns

MBIST, LBIST & Low-Power DFT

  • Memory BIST (MBIST)
  • March algorithms
  • Memory redundancy and repair logic
  • Logic BIST (LBIST)
  • PRPG and MISR-based architectures
  • Low-power DFT
  • UPF/CPF-based DFT integration
  • Multi-voltage and power-gated domain support
  • DFT integration for ECO-heavy designs

Validation, Debug & DFT Signoff

  • RTL-level DFT integration and validation
  • Physical-level DFT integration
  • Post-silicon debug support
  • Scan dump analysis
  • Failure diagnostics
  • Full-chip DFT ownership
  • Block-level DFT implementation
  • DFT flow integration across Synopsys, Cadence and Siemens EDA environments