Design For Test(DFT)

Ensuring Testability from Concept to Silicon

Capabilities: Design For Testability

Asmicore offers high-efficiency DFT solutions for complex SoCs and advanced nodes. We streamline testing and debugging to accelerate time-to-market while meeting PPA goals. Our end-to-end DFT services include scan insertion, ATPG, MBIST, Logic BIST, and more. We ensure RTL and physical-level integration, supporting power-gated and ECO-heavy designs. Our flows are compatible with Synopsys, Cadence, and Siemens EDA tools. Whether you’re developing automotive chips, mobile SoCs, AI accelerators, or low-power IoT devices, we deliver effective cross-domain DFT solutions. With Asmicore, you gain agility, reliability, and innovation in every stage of your DFT journey and we ensure with care that Clients benefit from full-chip or block-level DFT ownership based on specific design needs

Summary on Competency

  • Scan chain insertion and stitching (full and partial scan)
  • Scan chain insertion and stitching (full and partial scan)
  • Hierarchical scan implementation with chain balancing and reordering
  • High-coverage ATPG for stuck-at, transition, and path delay faults
  • Fault simulation, fault grading, and debug analysis
  • Test compression integration (DFTMAX, Tessent, Modus) to reduce test data and time
  • Memory BIST (MBIST) with march algorithms, redundancy, and repair logic
  • Logic BIST (LBIST) using PRPG and MISR architectures for in-field and safety-critical testing
  • Boundary scan and JTAG integration (IEEE 1149.1 / 1149.6 compliant)
  • iJTAG (IEEE 1687) support for embedded instrument access and in-system test
  • IEEE 1500 wrapper insertion for core-level test encapsulation
  • Clock controller insertion for scan/capture phase management and clock muxing
  • Low-power DFT with UPF/CPF-based design support (multi-voltage, power-gated domains)
  • DFT design constraint definition (SDC/test mode/timing exceptions)
  • Timing simulation and validation of scan and at-speed, path delay test patterns
  • Post-silicon debug support with scan dumps and failure diagnostics
  • Toolchain expertise: Synopsys (DFTMAX, TetraMAX, VCS), Cadence (Modus, Genus, Xcelium), Siemens (Tessent, FastScan, MBISTArchitect)